Principle of optimal accuracy classification for metrological purposes

The conceptions of optimizing a quantitative classification hierarchy and the criterion of informational optimality have been used for modeling universal accuracy classification scale. Proposed model is based on test uncertainty ratios determined in conformity with optimal levels of confidence in evaluating measurement uncertainty, as well as on the optimal classification structure. The author believes that this paper may be of interest and practical value for professionals engaged in improving metrological estimations.

Citation

JD 10.0.3-1 Report on scientific work. "Informatively optimal combining, expanding, and establishing traceability in evaluating measurement uncertainties". The National Physical Laboratory of Israel (INPL). Jerusalem, 2011.

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